Incorporation of a frequency-dependent dielectric response for the barrier material in the josephson junction circuit model

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 3, 2005, Pages 3886-3899

  Yu, Lei ^a   Newman, Nathan ^a   Rowell, John M ^a   Van Duzer, Theodore ^b  

^a Arizona State University   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Circuit modeling; Josephson junctions; Nonlinear equations; Superconductor normal superconductor (SNS) devices

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIELECTRIC MATERIALS; HYSTERESIS; MATHEMATICAL MODELS;

FREE CARRIERS; JUNCTION VOLTAGE; PLASMA FREQUENCY;

JOSEPHSON JUNCTION DEVICES;

EID: 25644459978     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.854302     Document Type: Article

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