Can RSFQ logic circuits be scaled to deep submicron junctions?

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 1050-1055

  Kadin, Alan M ^a,b   Mancini, Cesar A ^c,d   Feldman, Marc J ^c   Brock, Darren K ^b  

^a University of Rochester   (United States)

^b HYPRES INC   (United States)

^c UNIVERSITY OF ROCHESTER   (United States)

^d MOTOROLA INC   (United States)

Author keywords

High speed electronics; Integrated circuits; Josephson junctions; Superconducting devices

Indexed keywords

AREAL DENSITY; DEEP SUBMICRON JUNCTIONS; EXTERNAL SHUNT RESISTORS; SELFHEATING; SINGLE FLUX QUANTUM PULSES;

CURRENT DENSITY; ELECTRIC INDUCTORS; ENERGY GAP; HEATING; INTEGRATED CIRCUIT LAYOUT; LOGIC CIRCUITS; MATHEMATICAL MODELS; NIOBIUM; RESISTORS; WSI CIRCUITS;

JOSEPHSON JUNCTION DEVICES;

EID: 0035268019     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919528     Document Type: Conference Paper

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