Microstructure of ErBa2Cu3O7-δ films with BaZrO3 dispersion pinning centers for high JC applications

Physica C: Superconductivity and its Applications

Volumn 426-431, Issue II, 2005, Pages 1415-1418

  Ito, M ^a,g   Mukaida, M ^a,g   Ohazama, T ^a   Kita, R ^b,g   Ichinose, A ^c,g   Horii, S ^d,g   Saito, A ^a   Matsumoto, K ^e,g   Yoshida, Y ^f,g   Koike, K ^a   Hirose, F ^a   Ohshima, S ^a  

^a YAMAGATA UNIVERSITY   (Japan)

^b SHIZUOKA UNIVERSITY   (Japan)

^c CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

^e KYOTO UNIVERSITY   (Japan)

^f NAGOYA UNIVERSITY   (Japan)

^g JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

BZO; Critical current density; Surface resistance

Indexed keywords

BARIUM COMPOUNDS; ELECTRIC RESISTANCE; ERBIUM COMPOUNDS; MAGNETIC FIELDS; MICROSTRUCTURE; MICROWAVE DEVICES; SURFACE TREATMENT; TRANSMISSION ELECTRON MICROSCOPY;

BZO; DISPERSION PINNING CENTERS; SURFACE RESISTANCE;

SUPERCONDUCTING FILMS;

EID: 25644433479     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2005.02.109     Document Type: Article

References (5)

1. K. Matsumoto, T. Horide, K. Osamura, M. Mukaida, Y. Yoshida, A. Ichinose, and S. Horii Physica C 412-414 2004 1267
2. T. Ohazama, M. Mukaida, A. Ichinose, K. Matsumoto, Y. Yoshida, S. Horii, A. Saito, and S. Ohshima Physica C 412-414 2004 1301
3. S. Ohshima, M. Kusunoki, M. Inadomaru, M. Mukaida, Y. Tanaka, and H. Ihara IEEE Trans. Appl. Supercond. 13 2003 3578
4. M. Mukaida, and S. Miyazawa Jpn. J. Appl. Phys. 32 1993 4521
5. M. Mukaida, S. Miyazawa, M. Sasaura, and K. Kuroda Jpn. J. Appl. Phys. 29 1990 936