Growth of high-quality ErBa2Cu3O7-δ thin films

Physica C: Superconductivity and its Applications

Volumn 412-414, Issue SPEC. ISS., 2004, Pages 1301-1305

  Ohazama, T ^a,f,g   Mukaida, M ^a,f   Ichinose, A ^b,f   Matsumoto, K ^c,f   Yoshida, Y ^d,f   Horii, S ^e,f   Saito, A ^a   Ohshima, S ^a  

^a YAMAGATA UNIVERSITY   (Japan)

^b CENTRAL RESEARCH INSTITUTE OF ELECTRIC POWER INDUSTRY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

^d NAGOYA UNIVERSITY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

^f JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^g NONE   (Japan)

Author keywords

ErBa2Cu3O7 ; PLD; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); PULSED LASER DEPOSITION; SEMICONDUCTOR GROWTH; STRONTIUM COMPOUNDS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ERBA2CU3O7-Δ; SUBSTRATE TEMPERATURE; SURFACE RESISTANCE;

ERBIUM COMPOUNDS;

EID: 4644229276     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.02.226     Document Type: Conference Paper

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