Characterizations of undoped and Cu doped CdS thin films using photothermal and other techniques

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 3, 2005, Pages 425-434

  Paulraj, M ^a   Ramkumar, S ^b   Varkey, K P ^c   Vijayakumar, K P ^a   Kartha, C Sudha ^a   Nair, K G M ^d  

^a Department of Physics   (India)

^b RAJAGIRI SCHOOL OF ENGINEERING AND TECHNOLOGY   (India)

^c Government College of Engineering   (India)

^d INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN SIZE; LATTICE STRAINS; PHOTOTHERMAL DEFLECTION SPECTROSCOPY (PDS); PHOTOTHERMAL EFFECTS;

CADMIUM SULFIDE; CARRIER MOBILITY; CHARACTERIZATION; COPPER; DOPING (ADDITIVES); SPECTROSCOPIC ANALYSIS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

EID: 25444525137     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200406918     Document Type: Article

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