Depth profiling of CdS homojunction using AES analysis

Bulletin of Materials Science

Volumn 20, Issue 8, 1997, Pages 1085-1087

  Varkey, K P ^a   IMAI, Jun ^a  

^a Department of Physics   (India)

Author keywords

AES; Cadmium sulphide; Spray pyrolysis

Indexed keywords

ANNEALING; ATOMS; AUGER ELECTRON SPECTROSCOPY; COPPER; DIFFUSION; PYROLYSIS; SEMICONDUCTOR JUNCTIONS; THIN FILMS;

CADMIUM SULPHIDE; HOMOJUNCTION; SPRAY PYROLYSIS;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0031359987     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02745059     Document Type: Article

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