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Volumn 42, Issue 6, 2003, Pages 379-387
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ZnO columns obtaining. Variables control (I);Obtención de columnas de ZnO. Variables a controlar (I)
a a a a |
Author keywords
AFM; Factorial design at two levels; Semiconductors; ZnO
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTROLYTES;
ELECTROPLATING;
SEMICONDUCTOR MATERIALS;
SUBSTRATES;
TIN OXIDES;
CONDUCTIVE OXIDES;
ELECTROPLATING PROCESS;
FACTORIAL DESIGN;
GLASS SUBSTRATES;
MEASURED PARAMETERS;
PRINCIPAL FACTORS;
PROCESS TEMPERATURE;
ZINC OXIDE (ZNO);
ZINC OXIDE;
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EID: 25444524425
PISSN: 03663175
EISSN: None
Source Type: Journal
DOI: 10.3989/cyv.2003.v42.i6.626 Document Type: Article |
Times cited : (9)
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References (12)
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