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Volumn 44, Issue 24, 2005, Pages 5069-5075

High efficiency, high quality x-ray optic based on ellipsoidally bent highly oriented pyrolytic graphite crystal for ultrafast x-ray diffraction experiments

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; PHOTONS; PYROLYSIS; X RAY DIFFRACTION; X RAY OPTICS; X RAYS;

EID: 25444458870     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.005069     Document Type: Article
Times cited : (12)

References (18)
  • 1
    • 0017519187 scopus 로고
    • Doubly curved crystal point-focusing x-ray monochromators: Geometrical and practical optics
    • D. W. Berreman, J. Stamatoff, and S. J. Kennedy, "Doubly curved crystal point-focusing x-ray monochromators: geometrical and practical optics," Appl. Opt. 16, 2081-2085 (1977).
    • (1977) Appl. Opt. , vol.16 , pp. 2081-2085
    • Berreman, D.W.1    Stamatoff, J.2    Kennedy, S.J.3
  • 2
    • 0025792659 scopus 로고
    • X-ray microscopy of laser-produced plasmas with the use of bent crystals
    • E. Förster, I. Uschmann, and K Gäbel, "X-ray microscopy of laser-produced plasmas with the use of bent crystals," Laser Part. Beams 56, 135-148 (1991).
    • (1991) Laser Part. Beams , vol.56 , pp. 135-148
    • Förster, E.1    Uschmann, I.2    Gäbel, K.3
  • 10
    • 0002150038 scopus 로고
    • Highly oriented pyrolytic graphite
    • A. W. Moore, "Highly oriented pyrolytic graphite," Chem. Phys. Carbon 11, 69-187 (1973).
    • (1973) Chem. Phys. Carbon , vol.11 , pp. 69-187
    • Moore, A.W.1
  • 13
    • 0034474805 scopus 로고    scopus 로고
    • X-ray topographic determination of the granular structure in a graphite mosaic crystal: A three-dimensional reconstruction
    • and references therein
    • M. Ohler, M. Sanchez del Rio, A. Tuffannelli, M. Gambaccini, A. Taibi, A. Fantini, and G. Pareschi, "X-ray topographic determination of the granular structure in a graphite mosaic crystal: a three-dimensional reconstruction," J. Appl. Cryst. 33, 1023-1030 (2000), and references therein.
    • (2000) J. Appl. Cryst. , vol.33 , pp. 1023-1030
    • Ohler, M.1    Del Rio, M.S.2    Tuffannelli, A.3    Gambaccini, M.4    Taibi, A.5    Fantini, A.6    Pareschi, G.7
  • 15
    • 0016535440 scopus 로고
    • Integral reflection coefficient of X-ray spectrometer crystals
    • J. V. Gilfrich, D. B. Brown, and P. G. Burkhalter, "Integral reflection coefficient of X-ray spectrometer crystals," Appl. Spectrosc. 29, 322-326 (1975).
    • (1975) Appl. Spectrosc. , vol.29 , pp. 322-326
    • Gilfrich, J.V.1    Brown, D.B.2    Burkhalter, P.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.