Structural determination of sintered Si3N4/SiC nanocomposite using the XPS differential charge effect

Journal of Electron Spectroscopy and Related Phenomena

Volumn 109, Issue 3, 2000, Pages 241-248

  Tenegal F ^a   Gheorghiu De La Rocque, A ^a   Dufour, G ^a   Senemaud C ^a   Doucey, B ^b   Bahloul Hourlier, D ^b   Goursat, P ^b   Mayne, M ^c   Cauchetier, M ^c  

^a Université Pierre et Marie Curie   (France)

^b UNIVERSITY OF LIMOGES   (France)

^c Centre d Etudes Nucléaires de Saclay   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PARTICLES (PARTICULATE MATTER); SILICON CARBIDE; SILICON NITRIDE; SINTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

DIFFERENTIAL CHARGE EFFECT; NANOPARTICLES;

NANOSTRUCTURED MATERIALS;

EID: 2542509307     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00180-8     Document Type: Article

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