Angle resolved ultraviolet photoelectron spectroscopy of oriented sexiphenyl layers

Synthetic Metals

Volumn 111, Issue , 2000, Pages 591-594

  Schurmann H ^a   Koch, N ^b   Vollmer, A ^a   Schrader, S ^c   Neumann, M ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^c UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BAND STRUCTURE; CHEMICAL VAPOR DEPOSITION; EVAPORATION; MOLECULAR DYNAMICS; MOLECULAR ORIENTATION; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; ULTRATHIN FILMS; ULTRAVIOLET SPECTROSCOPY;

ANGLE RESOLVED ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; FILM THICKNESS; INTRAMOLECULAR INTERACTION; SEXIPHENYL; VALENCE STRUCTURE;

ORGANIC CONDUCTORS;

EID: 2542508967     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(99)00316-1     Document Type: Article

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