Electrical resistance of ultra thin Ag-, Cu- and Mn-films on Ge-substrates

Thin Solid Films

Volumn 458, Issue 1-2, 2004, Pages 322-324

  Schroder, Klaus ^a   Hollander, Jonathan ^b  

^a Syracuse University   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Copper; Manganese; Resistivity; Silver

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; COPPER; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; MANGANESE; SILVER; SOLUBILITY; THERMAL EFFECTS;

BULK RESISTIVITY; GROWTH MECHANISMS; METALLIC LAYERS; SHEET RESISTANCE;

THIN FILMS;

EID: 2542478391     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.12.060     Document Type: Article

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