Protocol for the characterization of single-wall carbon nanotube material quality

Carbon

Volumn 42, Issue 8-9, 2004, Pages 1783-1791

  Arepalli, Sivaram ^a   Nikolaev, Pavel ^a   Gorelik, Olga ^a   Hadjiev, Victor G ^b   Holmes, Williams ^a   Files, Bradley ^a   Yowell, Leonard ^a  

^a NASA JOHNSON SPACE CENTER   (United States)

^b UNIVERSITY OF HOUSTON   (United States)

Author keywords

A. Carbon nanotubes; C. Thermal analysis, electron microscopy; D. Defects; Raman spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; DEFECTS; ELECTRON MICROSCOPY; LASER ABLATION; NEUTRON DIFFRACTION; RAMAN SPECTROSCOPY; THERMOANALYSIS; THERMOGRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROMETERS; X RAY DIFFRACTION;

LASER-INDUCED FLUORESCENCE (LIF); PROTONATION; RAMAN BREATHING MODE (RBM); ULTRA-SONICATION;

CARBON NANOTUBES;

EID: 2542448412     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2004.03.038     Document Type: Article

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