Phase extraction from electronic speckle patterns by statistical analysis

Optics Communications

Volumn 236, Issue 4-6, 2004, Pages 259-269

  Tay, C J ^a   Quan, C ^a   Chen, L ^a   Fu, Y ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Electronic speckle pattern; Phase extraction; Statistical analysis

Indexed keywords

ALGORITHMS; INVERSE PROBLEMS; MATHEMATICAL OPERATORS; MATHEMATICAL TRANSFORMATIONS; PHASE SHIFT; PROBABILITY DENSITY FUNCTION; STATISTICAL METHODS;

ELECTRONIC SPECKLE PATTERN; INFORMATION CARRIERS; PHASE EXTRACTION; PHASE MAPS;

SPECKLE;

EID: 2542445470     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2004.03.039     Document Type: Article

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