TEM-examination and computer simulation of nano-scale multilayers by pulsed cathodic arc deposition

Journal of Ceramic Processing Research

Volumn 4, Issue 3, 2003, Pages 115-117

  Chun, Sung Yong ^a  

^a Mokpo National University   (South Korea)

Author keywords

Multilayers and TRIDYN; Pulsed cathodic arc

Indexed keywords

ANALYTIC METHOD; ARTICLE; CHEMICAL REACTION; COMPARATIVE STUDY; COMPUTER SIMULATION; NANOTECHNOLOGY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 2542441549     PISSN: 12299162     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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