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Volumn 242, Issue 11, 2005, Pages

Prediction of the X-ray absorption near edge structure of the new high-density phase of SiO2

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[No Author keywords available]

Indexed keywords


EID: 25144508135     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200541029     Document Type: Article
Times cited : (10)

References (16)
  • 12
    • 25144466817 scopus 로고    scopus 로고
    • to be published
    • T. Mizoguchi et al., to be published.
    • Mizoguchi, T.1
  • 15
    • 26744447257 scopus 로고
    • The lattice parameters used in Ref. [6] are the same as in the earlier papers: Y. P. Li and W. Y. Ching, Phys. Rev. B 31, 2172-2179 (1985);
    • (1985) Phys. Rev. B , vol.31 , pp. 2172-2179
    • Li, Y.P.1    Ching, W.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.