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Volumn 242, Issue 11, 2005, Pages
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Prediction of the X-ray absorption near edge structure of the new high-density phase of SiO2
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 25144508135
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/pssb.200541029 Document Type: Article |
Times cited : (10)
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References (16)
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