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Volumn 5754, Issue PART 1, 2005, Pages 587-598
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Investigation of polarization effects on new mask materials
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Author keywords
Binary masks; High NA; High transmission masks; Immersion lithography; Polarization
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Indexed keywords
COMPUTER SIMULATION;
DIFFRACTION;
ELLIPSOMETRY;
LIGHT ABSORPTION;
MASKS;
REFLECTOMETERS;
BINARY MASKS;
HIGH NA;
HIGH TRANSMISSION MASKS;
IMMERSION LITHOGRAPHY;
LIGHT POLARIZATION;
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EID: 25144474879
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.599688 Document Type: Conference Paper |
Times cited : (14)
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References (12)
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