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Volumn 5765, Issue PART 2, 2005, Pages 1148-1159
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An initial investigation of the large strain and fatigue loading behavior of piezoelectric wafer active sensors
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Author keywords
Damage detection; Electromechanical impedance; Fatigue loading; Piezoelectric wafer active sensors; PWAS; SHM; Strain loading; Structural health monitoring
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Indexed keywords
ALUMINA;
DATA REDUCTION;
FATIGUE OF MATERIALS;
PIEZOELECTRIC DEVICES;
STRAIN;
TENSILE TESTING;
DAMAGE DETECTION;
PIEZOELECTRIC WAFER ACTIVE SENSORS;
PWAS;
SHM;
STRAIN LOADING;
STRUCTURAL HEALTH MONITORING;
SENSORS;
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EID: 25144462485
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.599853 Document Type: Conference Paper |
Times cited : (7)
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References (12)
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