High-energy X-ray photoelectron spectroscopy study of MBE grown (Eu, Gd) Te layers

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 238, Issue 1-4, 2005, Pages 346-352

  Orlowski, B A ^a   Mickievicius, S ^b   Osinniy, V ^a   Nadolny, A J ^a   Taliashvili, B ^a   Dziawa, P ^a   Story, T ^a   Medicherla, R ^c   Drube, W ^c  

^a INSTITUTE OF PHYSICS   (Poland)

^b CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^c DESY   (Germany)

Author keywords

Magnetic semiconductors; Photoemission spectroscopy; Rare earth chalcogenide; Synchrotron radiation

Indexed keywords

ANTIFERROMAGNETISM; ELECTRONIC STRUCTURE; GADOLINIUM; MAGNETIC PROPERTIES; MAGNETIC SEMICONDUCTORS; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; OXIDATION; SYNCHROTRON RADIATION;

MAGNETIC IONS; PHOTOEMISSION SPECTROSCOPY; RARE EARTH CHALCOGENIDES; SEMICONDUCTOR ALLOYS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 25144435889     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.06.074     Document Type: Conference Paper

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