Photoemission study of EuS layers buried in PbS

Journal of Electron Spectroscopy and Related Phenomena

Volumn 137-140, Issue SPEC. ISS., 2004, Pages 763-767

  Orlowski, B A ^a   Mickevicius S ^b   Chernyshova, M ^a   Demchenko, I ^a   Sipatov, A Y ^c   Story, T ^a   Medicherla, V ^d   Drube, W ^d  

^a INSTITUTE OF PHYSICS   (Poland)

^b CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^c NATIONAL TECHNICAL UNIVERSITY   (Ukraine)

^d DESY   (Germany)

Author keywords

Lead and europium monosulfide; Photoemission spectroscopy; Semiconductor buried layer; Synchrotron radiation

Indexed keywords

EUROPIUM COMPOUNDS; ION BOMBARDMENT; LEAD COMPOUNDS; MULTILAYERS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; SPECTRUM ANALYSIS; STOICHIOMETRY;

CURIE TEMPERATURE; LATTICE MISMATCH; LEAD AND EUROPIUM MONOSULFIDE; SEMICONDUCTOR BURIED LAYER;

PHOTOELECTRON SPECTROSCOPY;

EID: 2942532962     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.02.096     Document Type: Conference Paper

References (20)

1. Prinz G.A. Science. 282:1998;1660.
2. Kêpa H., Kutner-Pielaszek J., Blinowski J., Twardowski A., Majkrzak C.F., Story T., Kacman P., Galazka R.R., Ha K., de Jonge H.J.M., Sipatov A.Y., Volobuev V., Giebutowicz T.M. Europhys. Lett. 56(1):2001;54.
3. Kêpa H., Goldman K.I., Giebutowicz T.M., Majkrzak C.F., Springholz G., Krenn H., Holl S., Schinagl F., Bauer G. Physica E. 2:1998;399.
4. Rhyne J.J., Lin J., Furdyna J.K., Giebutowicz T.M. J. Magn. Magn. Mater. 177-181:1998;1195.
5. Nunez V., Giebutowicz T.M., Faschinger W., Bauer G., Sitter H., Furdyna J.K. J. Magn. Magn. Mater. 140-144:1995;633.
6. Cho E.-J., Oh S.-J. Phys. Rev. B. 59:1999;R15613.
7. McFeely et al., Phys. Rev. B 7 (1973) 5228.
8. Grandke T., Ley L., Cordona M. Phys. Rev. Lett. 38:1977;1033.
9. Muscat J., Klauber C. Surf. Sci. 491:2001;226.
10. Vercaemst R., Poelman D., Fiermans L., Van Meirhaeghe R.L., Lafrere W.H., Cardon F. J. Electron Spectrosc. Relat. Phenom. 74:1995;45.
11. B.A. Orlowski, E. Guziewicz, B.J. Kowalski, T. Story, S. Mickevièius, A.Y. Sipatov, M. Chernyshova, I. Demchenko, N. Barett, M. Taniguchi, A. Kimura, H. Sato, C.A. Sebenne, J.P. Lacharme, R. Medicherla, W. Drube, J. Alloys Comp. 362 (2004) 202.
12. Ohno Y., Urata T. J. Electron Spectrosc. Relat. Phenom. 125:2002;171.
13. Buscow K.H.J., Campagna M., Wertheim G.K. Solid State Commun. 24:1977;253.
14. Cho E.-J., Oh S.-J. Phys. Rev. B. 59:1999;R15613.
15. E.-J. Cho, S.-J. Oh, S. Imada, S. Suga, T. Suzuki, T. Kasuya, Phys. Rev. B 51 (1995) 10146.
16. Kotani A., Ogasawara H. J. Electron Spectrosc. Relat. Phenom. 60:1992;257.
17. Gerth Ch., Godehusen K., Richter M., Zimmermann P., Schulz J., Wernet Ph., Sonntag B., Kochur A.G., Petrov I.D. Phys. Rev. A. 61:2000;022713.
18. Denecke R., Ley L., Springholz G., Bauer G. Phys. Rev. B. 53:1996;4534.
19. Felser C., Kõhler J., Simon A., Jepsen O., Svensson G., Cramm S., Eberhardt W. Phys. Rev. B. 57:1998;1510.
20. Schneider W.D., Laubschat C., Kalkowski G., Haase J., Puschmann A. Phys. Rev. B. 28:1983;2017.