On-line fabric-defects detection based on wavelet analysis

Lecture Notes in Computer Science

Volumn 3483, Issue IV, 2005, Pages 1075-1084

  Kim, Sungshin ^a   Bae, Hyeon ^a   Cheon, Seong Pyo ^a   Kim, Kwang Baek ^b  

^a Pusan National University   (South Korea)

^b Silla University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DEFECTS; INSPECTION; ONLINE SYSTEMS; OPTIMIZATION; SIGNAL TO NOISE RATIO; WAVELET TRANSFORMS;

FABRIC DEFECTS; HORIZONTAL SCANNING ALGORITHMS; INSPECTION SYSTEM; WAVELET ANALYSIS;

COMPUTER SCIENCE;

EID: 24944575353     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/11424925_112     Document Type: Conference Paper

References (10)

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2. Vachtsevanos, G., Dorrity, J.L., Kumar, A., Kim, S.: Advanced application of statistical and fuzzy control to textile processes. IEEE Trans. on Industry Applications. 30 (1994) 510-516
3. Jasper, W.J., Garnier, S.J.,Potlapalli, H.: Texture characterization and defect detection using adaptive wavelets. Optical Engineering, 35 (1996) 3140-3149
4. Brad R. and Brad R.: Quality Assurance by Automated Defect Detection of Textile Fabrics. Proc. of XI-th Int. Symp. SINTES, vol. II. Craiova Romania (2003) 487-491
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10. Rao, S.S.: Optimization-Theory and Applications. New York, John Wiley Sons (1984) 292-300