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Volumn , Issue , 2004, Pages 324-331
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Online testable reversible logic circuit design using NAND blocks
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Author keywords
[No Author keywords available]
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Indexed keywords
BENCHMARK CIRCUITS;
COMPLEXITY LEVELS;
SUBSETS;
BENCHMARKING;
SET THEORY;
LOGIC CIRCUITS;
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EID: 24944558180
PISSN: 15505774
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/DFTVS.2004.1347856 Document Type: Conference Paper |
Times cited : (41)
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References (9)
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