The interferometric mirage effect method: The determination of the thermal diffusivity of CdMnTe

Microelectronics Journal

Volumn 36, Issue 10, 2005, Pages 917-921

  Corona Organiche, E ^a   Lopez Cruz E ^b   Vazquez Lopez C ^c   Morales, Juan E ^d  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b BENEMÉRITA UNIVERSIDAD AUTÓNOMA DE PUEBLA   (Mexico)

^c DEPARTAMENTO DE FÍSICA   (Mexico)

^d UNIVERSITY OF CONCEPCIÓN   (Chile)

Author keywords

CdMnTe semiconductor; Interferometric thermal instrument; Mirage effect; Thermal diffusivity

Indexed keywords

CDMNTE SEMICONDUCTORS; INTERFEROMETRIC THERMAL INSTRUMENT; MIRAGE EFFECT;

ELECTROLYSIS; INTERFEROMETERS; MANGANESE; THERMAL DIFFUSION; ZINC ALLOYS;

CADMIUM COMPOUNDS;

EID: 24944521871     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2005.05.023     Document Type: Conference Paper

References (13)

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