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Volumn 15, Issue 17-19, 2001, Pages 613-616
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Interferometric measurementes of photothermal deflection
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Author keywords
[No Author keywords available]
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Indexed keywords
CADMIUM;
TECHNETIUM;
ZINC;
CONFERENCE PAPER;
DIFFUSION;
MEASUREMENT;
MOLECULAR MODEL;
PHOTOACTIVATION;
SEMICONDUCTOR;
THERMAL ANALYSIS;
THERMODILUTION;
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EID: 0035921489
PISSN: 02179849
EISSN: None
Source Type: Journal
DOI: 10.1142/S0217984901002129 Document Type: Conference Paper |
Times cited : (5)
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References (4)
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