SCOPUS 정보 검색 플랫폼

Journal of Materials Science: Materials in Electronics

Volumn 16, Issue 7, 2005, Pages 393-396

Structural and electrical characterization of AgInS2 thin films grown by single-source thermal evaporation method

(6) Akaki, Y a Kurihara, S a Shirahama, M a Tsurugida, K a Kakeno, T b Yoshino, K b

a MIYAKONOJO NATIONAL COLLEGE OF TECHNOLOGY (Japan)

b UNIVERSITY OF MIYAZAKI (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; EVAPORATION; FILM GROWTH; GRAIN SIZE AND SHAPE; SEMICONDUCTING FILMS; SURFACE STRUCTURE; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; SINGLE-SOURCE THERMAL EVAPORATION METHOD; VAN DER PAUW TECHNIQUE;

SEMICONDUCTING SILVER COMPOUNDS;

EID: 24944518329 PISSN: 09574522 EISSN: None Source Type: Journal
DOI: 10.1007/s10854-005-2303-7 Document Type: Article

Times cited : (9)

References (13)

1
- 0038575800
- 10.1002/pip.494
- K. RAMANATHAN, M. A. CONTRERAS, C. L. PERKINS, S. ASHER, F. S. HASOON, J. KEANE, D. YOUNG, M. ROMERO, W. METZGER, R. NOUFI, J. WARD and A. DUDA, Prog. Photovol. Res. Appl. 11 (2003) 225. 10.1002/pip.494
- (2003) Prog. Photovol. Res. Appl. , vol.11 , pp. 225
- Ramanathan, K.¹ Contreras, M.A.² Perkins, C.L.³ Asher, S.⁴ Hasoon, F.S.⁵ Keane, J.⁶ Young, D.⁷ Romero, M.⁸ Metzger, W.⁹ Noufi, R.¹⁰ Ward, J.¹¹ Duda, A.¹²

2
- 0000496927
- 10.1103/PhysRevB.9.1719
- J. L. SHAY, B. TELL, L. M. SCHIAVONE, H. M. KASPER and F. THIEL, Phys. Rev. B. 9 (1972) 1719. 10.1103/PhysRevB.9.1719
- (1972) Phys. Rev. B. , vol.9 , pp. 1719
- Shay, J.L.¹ Tell, B.² Schiavone, L.M.³ Kasper, H.M.⁴ Thiel, F.⁵

3
- 0016569032
- 10.1063/1.321521
- L. L. KAZMERSKI, M. S. AYYAGARI and G. A. SANBORN, J. Appl. Phys. 46 (1975) 4865. 10.1063/1.321521
- (1975) J. Appl. Phys. , vol.46 , pp. 4865
- Kazmerski, L.L.¹ Ayyagari, M.S.² Sanborn, G.A.³

4
- 0029307463
- 10.1016/0022-0248(95)80129-Z
- S. NIKI, Y. MAKITA, A. YAMADA, O. HELLMAN, P. J. FONS, A. OBARA, Y. Okada, R. SHIODA, H. OYANAGI, T. KURAFUJI, S. CHICHIBU and H. NAKANISHI, J. Cryst. Growth 150 (1995) 1201. 10.1016/0022-0248(95)80129-Z
- (1995) J. Cryst. Growth , vol.150 , pp. 1201
- Niki, S.¹ Makita, Y.² Yamada, A.³ Hellman, O.⁴ Fons, P.J.⁵ Obara, A.⁶ Okada, Y.⁷ Shioda, R.⁸ Oyanagi, H.⁹ Kurafuji, T.¹⁰ Chichibu, S.¹¹ Nakanishi, H.¹²

5
- 0039149682
- 10.1063/1.1405132
- S. H. YOU, K. J. HONG, C. J. YOUN, T. S. JEONG, J. D. MOON, H. S. KIM and J. S. PARK, J. Appl. Phys. 90 (2001) 3894. 10.1063/1.1405132
- (2001) J. Appl. Phys. , vol.90 , pp. 3894
- You, S.H.¹ Hong, K.J.² Youn, C.J.³ Jeong, T.S.⁴ Moon, J.D.⁵ Kim, H.S.⁶ Park, J.S.⁷

6
- 0018481429
- 10.1016/0040-6090(79)90184-6
- B. PAMPLIN and R. S. FEIGELSON, Thin Solid Films 60 (1979) 141. 10.1016/ 0040-6090(79)90184-6
- (1979) Thin Solid Films , vol.60 , pp. 141
- Pamplin, B.¹ Feigelson, R.S.²

7
- 49149143022
- 10.1016/0040-6090(80)90467-8
- M. GORSKA, R. BEAULIEU, J. J. LOFERSKE and B. ROESSLER, Thin Solid Film 67 (1980) 341. 10.1016/0040-6090(80)90467-8
- (1980) Thin Solid Film , vol.67 , pp. 341
- Gorska, M.¹ Beaulieu, R.² Loferske, J.J.³ Roessler, B.⁴

8
- 0042737825
- Y. AKAKI, H. KOMAKI, K. YOSHINO and T. IKARI, J. Mater. Sci. 64 (2003) 1863.
- (2003) J. Mater. Sci. , vol.64 , pp. 1863
- Akaki, Y.¹ Komaki, H.² Yoshino, K.³ Ikari, T.⁴

9
- 0042737825
- 10.1016/S0022-3697(03)00249-X
- Y. AKAKI, H. KOMAKI, H. YOKOYAMA, K. YOSHINO, K. MAEDA and T. IKARI, J. Phys. Chem. Solids 64 (2003) 1863. 10.1016/S0022-3697(03)00249-X
- (2003) J. Phys. Chem. Solids , vol.64 , pp. 1863
- Akaki, Y.¹ Komaki, H.² Yokoyama, H.³ Yoshino, K.⁴ Maeda, K.⁵ Ikari, T.⁶

10
- 0041736474
- 10.1016/S0022-3697(03)00097-0
- K. YOSHINO, H. KOMAKI, T. KAKENO, Y. AKAKI and Y. IKARI, J. Phys. Chem. Solids 64 (2003) 1839. 10.1016/S0022-3697(03)00097-0
- (2003) J. Phys. Chem. Solids , vol.64 , pp. 1839
- Yoshino, K.¹ Komaki, H.² Kakeno, T.³ Akaki, Y.⁴ Ikari, Y.⁵

11
- 24944543717
- JCPDS file No. 25-1330
- JCPDS file No. 25-1330.

12
- 0036649687
- 10.1116/1.1488944
- Y. AKAKI, H. KOMAKI, K. YOSHINO and T. IKARI, J. Vac. Sci. Tech. 20 (2002) 1486. 10.1116/1.1488944
- (2002) J. Vac. Sci. Tech. , vol.20 , pp. 1486
- Akaki, Y.¹ Komaki, H.² Yoshino, K.³ Ikari, T.⁴

13
- 0001413017
- 10.1063/1.350938
- K. HATTORI, K. AKAMATSU and J. N. KAMEGASHIRA, J. Appl. Phys. 71 (1992) 3414. 10.1063/1.350938
- (1992) J. Appl. Phys. , vol.71 , pp. 3414
- Hattori, K.¹ Akamatsu, K.² Kamegashira, J.N.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.