Surface morphology of evaporated CuInS2 thin films grown by single source thermal evaporation technique

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 20, Issue 4, 2002, Pages 1486-1487

  Akaki, Youji ^a   Komaki, Hironori ^a   Yoshino, Kenji ^a   Ikari, Tetsuo ^a  

^a UNIVERSITY OF MIYAZAKI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; EVAPORATION; MORPHOLOGY; OPTICAL MICROSCOPY; PROBES; SEMICONDUCTOR GROWTH; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

COPPER INDIUM SULFIDE; FOUR POINT PROBE METHOD; THERMAL EVAPORATION TECHNIQUE; THERMOPROBE ANALYSIS;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0036649687     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1488944     Document Type: Article

References (8)