An efficient perfect algorithm for memory repair problems

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2004, Pages 306-313

  Lin, Hung Yau ^a   Yeh, Fu Min ^b   Chen, Ing Yi ^c   Kuo, Sy Yen ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (Taiwan)

^c NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY DECISION DIAGRAMS (BDD); BIPARTITE GRAPHS; MEMORY REPAIR; SUBGRAPHS;

ALGORITHMS; BOOLEAN ALGEBRA; FUNCTIONS; GRAPH THEORY; MATHEMATICAL MODELS;

DATA STORAGE EQUIPMENT;

EID: 24944456894     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2004.1347853     Document Type: Conference Paper

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