X-ray photoelectron spectroscopy study of MBE-grown Gd/EuTe multilayers

Journal of Alloys and Compounds

Volumn 401, Issue 1-2, 2005, Pages 150-154

  Mickevicius S ^a   Orlowski, B A ^b   Andrulevicius M ^c   Tamulevicius S ^c   Puiso J ^c   Baczewski, L T ^b   Maneikis, A ^b  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^b INSTITUTE OF PHYSICS   (Poland)

^c KAUNAS UNIVERSITY OF TECHNOLOGY   (Lithuania)

Author keywords

Crystal growth; Europium telluride; Gadolinium; Molecular beam epitaxy; Photoelectron spectroscopies; Surfaces and interfaces

Indexed keywords

ALUMINUM; CHARACTERIZATION; CRYSTAL GROWTH; EUROPIUM COMPOUNDS; GADOLINIUM; MOLECULAR BEAM EPITAXY; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

EUROPIUM TELLURIDE; PHOTOEMISSION SPECTRA; SURFACE AND INTERFACES;

MULTILAYERS;

EID: 24744456656     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2005.03.083     Document Type: Article

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