메뉴 건너뛰기




Volumn 154, Issue 1-3, 2005, Pages 9-12

Measuring the tilt angle of ODTMS self-assembled monolayers on Al oxide surfaces

Author keywords

Coatings; Order disorder phase transitions; Organic inorganic interfaces; Polycrystalline surfaces; Self assembly using surface chemistry; X ray absorption spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ADSORPTION; ALUMINUM COMPOUNDS; COATINGS; CORRELATION METHODS; ORDER DISORDER TRANSITIONS; POLYCRYSTALLINE MATERIALS; SAMPLING; SELF ASSEMBLY; SILANES; SURFACE CHEMISTRY; X RAY ANALYSIS; X RAY SPECTROSCOPY;

EID: 24644506721     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2005.07.002     Document Type: Conference Paper
Times cited : (2)

References (30)
  • 26
    • 24644440945 scopus 로고    scopus 로고
    • B. Watts, L. Thomsen and P.C. Dastoor, in prep.
    • B. Watts, L. Thomsen and P.C. Dastoor, in prep.
  • 28
    • 24644511106 scopus 로고    scopus 로고
    • note
    • 2 with tilt angle is obtained and by scaling appropriately with the measured σ value the error in the fitted tilt parameter is obtained. The errors are calculated at the 95% confidence (2σ) level.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.