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Volumn 5751, Issue I, 2005, Pages 260-271
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Integrating Philips' extreme UV source in the alpha-tools
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Author keywords
EUV Lithography; EUV source; Gas discharge plasma; Halogen cycle
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Indexed keywords
DOSIMETRY;
ELECTRODES;
HALOGEN COMPOUNDS;
INCANDESCENT LAMPS;
LASER BEAMS;
PROBLEM SOLVING;
TIN;
VACUUM;
XENON;
EUV LITHOGRAPHY;
EUV SOURCE;
GAS DISCHARGE PLASMA;
HALOGEN CYCLE;
ULTRAVIOLET RADIATION;
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EID: 24644496630
PISSN: 16057422
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.598650 Document Type: Conference Paper |
Times cited : (33)
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References (9)
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