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Volumn 5751, Issue I, 2005, Pages 260-271

Integrating Philips' extreme UV source in the alpha-tools

Author keywords

EUV Lithography; EUV source; Gas discharge plasma; Halogen cycle

Indexed keywords

DOSIMETRY; ELECTRODES; HALOGEN COMPOUNDS; INCANDESCENT LAMPS; LASER BEAMS; PROBLEM SOLVING; TIN; VACUUM; XENON;

EID: 24644496630     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.598650     Document Type: Conference Paper
Times cited : (33)

References (9)
  • 2
    • 24644459628 scopus 로고    scopus 로고
    • Philips' EUV lamp: Status and roadmap
    • Antwerp, Belgium
    • J. Pankert et al., "Philips' EUV lamp: Status and Roadmap", second EUV lithography conference, Antwerp, Belgium (2003)
    • (2003) Second EUV Lithography Conference
    • Pankert, J.1
  • 3
    • 0141612960 scopus 로고    scopus 로고
    • Collection efficiency of EUV sources
    • March 23-28, Santa Clara
    • G. Derra and W. Singer, "Collection efficiency of EUV sources", SPIE Microlithography 2003, March 23-28, Santa Clara (2003)
    • (2003) SPIE Microlithography 2003
    • Derra, G.1    Singer, W.2
  • 5
    • 24644478879 scopus 로고    scopus 로고
    • "Method of generating extreme ultraviolet generation", patent application WO 03/094581A1
    • G. Derra and U. Niemann, "Method of generating extreme ultraviolet generation", patent application WO 03/094581A1 (2003)
    • (2003)
    • Derra, G.1    Niemann, U.2
  • 7
    • 24644435727 scopus 로고    scopus 로고
    • Philips' EUV source: Update and issues
    • Miyazaki. Japan
    • J. Pankert et al., "Philips' EUV Source: Update and Issues", third EUV lithography conference, Miyazaki. Japan (2004)
    • (2004) Third EUV Lithography Conference
    • Pankert, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.