A t2 statistics based wavelet characteristic multivariate processing model applied to automated inspection of surface defects

Journal of the Chinese Institute of Industrial Engineers

Volumn 21, Issue 2, 2004, Pages 121-135

  Lin, Hong Dar ^a   Chen, Chih Sung ^a  

^a CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Hotelling T2 multivariate statistics; Ripple texture defect detection; Threshold techniques; Wavelet transformation

Indexed keywords

AUTOMATION; INSPECTION; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; STATISTICS; WAVELET TRANSFORMS;

HOTELLING T2 MULTIVARIATE STATISTICS; RIPPLE-TEXTURE DEFECT DETECTION; THRESHOLD TECHIQUES; WAVELET TRANSFORMATION;

MULTIVARIABLE SYSTEMS;

EID: 24644492801     PISSN: 10170669     EISSN: 21517606     Source Type: Journal    
DOI: 10.1080/10170660409509394     Document Type: Article

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