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Volumn 49, Issue SUPPL. 1, 2004, Pages

Investigation of structural perfection and acoustic properties of La 3Ga5SiO14 crystals by high resolution X-ray diffraction, topography, and microfluorescence analysis

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC PROPERTIES; ACOUSTIC WAVE PROPAGATION; CRYSTAL DEFECTS; CRYSTAL GROWTH; X RAY DIFFRACTION ANALYSIS;

EID: 24644491280     PISSN: 10637745     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (14)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.