Langasite and Langatate nonuniform material properties correlated to the performance of SAW devices

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn , Issue , 2001, Pages 235-239

  Fachberger, R ^a,c   Holzheu, T ^d,e   Riha, E ^c   Born, E ^b   Pongratz, P ^a   Cerva, H ^d  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c EPCOS AG   (Germany)

^d SIEMENS AG   (Germany)

^e CAMET Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; LANTHANUM COMPOUNDS; LATTICE CONSTANTS; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

TRANSVERSE GROWTH BANDING (TGB);

ACOUSTIC SURFACE WAVE DEVICES;

EID: 0035174347     PISSN: 01616404     EISSN: None     Source Type: Journal    
DOI: 10.1109/FREQ.2001.956194     Document Type: Article

References (13)

1. Langasite for high temperature surface acoustic wave applications
2. Analysis of surface acoustic wave properties of the rotated Y-cut langasite substrate
3. Determination of the piezoelectric constants of LGN, LGS, and LGT
4. Recent measurements of material constants vs. temperature …
5. Langasite surface acoustic wave sensors for high temperatures
6. Structure of microdefects in semiconducting materials
7. Growth of a 3″ langasite crystal with clear faceting
8. Growth of 3″ langasite single crystal and its application to substrate for surface acoustic wave filters
9. Growing the large lanthanum gallium silicate single crystals by czochralsky method
10. Study of congruent-melting composition of langasite and its effects on crystal quality
11. New results on high perfection langasite crystals: Studies of crystalline defects and modes shapes
12. Aspects of growing langasite crystals and their properties