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Volumn 87, Issue 9, 2005, Pages

Low-energy-channeling surface analysis on silicon crystals designed for high-energy-channeling in accelerators

Author keywords

[No Author keywords available]

Indexed keywords

LOW-ENERGY CHANNELING; MECHANICAL TREATMENT; RELATIVISTIC PARTICLES; SUPERFICIAL DAMAGED LAYER;

EID: 24644486639     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2033127     Document Type: Article
Times cited : (11)

References (17)
  • 9
    • 24644505366 scopus 로고    scopus 로고
    • E. N. Tsyganov. Fermilab TM-682, TM-684 (unpublished).
    • Tsyganov, E.N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.