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1
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4544346240
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SOP for miniaturized mixed-signal computing, communication and consumer systems of the next decade
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Accepted for, May
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R R Tummala, M Swaminathan, M Tentzeris, J Laskar, G K Chung, S Sitaraman, D Keezer, D Guidotti, R Huang, K Lim, L Wan, S Bhattacharya, V Sundaram, Fuhan Liu and P M Raj, "SOP for miniaturized mixed-signal computing, communication and consumer systems of the next decade", Accepted for IEEE Component Packaging and Manufacturing Technology (CPMT) Transactions on Advanced Packaging, pp. 250-267, May 2004
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(2004)
IEEE Component Packaging and Manufacturing Technology (CPMT) Transactions on Advanced Packaging
, pp. 250-267
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Tummala, R.R.1
Swaminathan, M.2
Tentzeris, M.3
Laskar, J.4
Chung, G.K.5
Sitaraman, S.6
Keezer, D.7
Guidotti, D.8
Huang, R.9
Lim, K.10
Wan, L.11
Bhattacharya, S.12
Sundaram, V.13
Liu, F.14
Raj, P.M.15
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2
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0030685188
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Flip chip and chip scale I/O density requirements and printed wiring board capabilities
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K V Guinn and R C Frye, "Flip Chip and Chip Scale I/O density Requirements and Printed Wiring Board Capabilities", 1997 Electronics Components and Technology Conference, pp. 649-655, 1997
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(1997)
1997 Electronics Components and Technology Conference
, pp. 649-655
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Guinn, K.V.1
Frye, R.C.2
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3
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4544239787
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Next-generation microvia and global wiring technologies for SOP
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May
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V Sundaram, R R Tummala, F Liu, P A Kohl, J Li, S A Bidstrup-Allen and Y Fukoka, "Next-generation microvia and global wiring technologies for SOP", IEEE Transactions on Advanced Packaging, pp. 315-325, May, 2004
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(2004)
IEEE Transactions on Advanced Packaging
, pp. 315-325
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Sundaram, V.1
Tummala, R.R.2
Liu, F.3
Kohl, P.A.4
Li, J.5
Bidstrup-Allen, S.A.6
Fukoka, Y.7
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4
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13944262135
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Warpage induced limitation of FR4 and need for alternate materials for microvia and global interconnect needs
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February
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S. Banerji, P. Markondeya Raj and Rao R Tummala, "Warpage induced limitation of FR4 and need for alternate materials for microvia and global interconnect needs", IEEE Component Packaging and Manufacturing Technology (CPMT) Transactions on Advanced Packaging, Vol 28, pp. 102-113, February, 2005
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(2005)
IEEE Component Packaging and Manufacturing Technology (CPMT) Transactions on Advanced Packaging
, vol.28
, pp. 102-113
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Banerji, S.1
Raj, P.M.2
Tummala, R.R.3
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6
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0346308261
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Organic, non-woven aramid reinforced substrates with controlled in-plane CTE means more reliable solder joint reliability
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S Khan, C G Gonzalez and M Weinhold, "Organic, Non-woven Aramid Reinforced Substrates with Controlled In-Plane CTE Means More Reliable Solder Joint Reliability", Advances in Electronic Packaging, vol 2, pp 1345-1362, 2001
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(2001)
Advances in Electronic Packaging
, vol.2
, pp. 1345-1362
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Khan, S.1
Gonzalez, C.G.2
Weinhold, M.3
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7
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3042708322
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Multilayer board with low coefficient of thermal expansion
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Proceedings
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rd International Symposium on Microelectronics, International Microelectronics and Packaging Society, pp. 235-240, 2000
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(2000)
rd International Symposium on Microelectronics, International Microelectronics and Packaging Society
, pp. 235-240
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Nakamura, K.1
Kaneto, M.2
Inoue, Y.3
Okeyui, T.4
Miyake, K.5
Oota, S.6
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8
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2042439117
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Enhanced reliability of High Density Wiring (HDW) substrates through new base substrate and dielectric materials
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May
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S Hegde, R V Pucha, S K Sitaraman, "Enhanced Reliability of High Density Wiring (HDW) Substrates through New Base Substrate and Dielectric Materials", Journal of Material Science: Materials in Electronics, Vol. 15, Issue 5, pp. 287-296, May 2004.
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(2004)
Journal of Material Science: Materials in Electronics
, vol.15
, Issue.5
, pp. 287-296
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Hegde, S.1
Pucha, R.V.2
Sitaraman, S.K.3
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10
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0036287233
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Micro-scale plasticity effects in microvia reliability analysis
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G Ramakrishna, R V Pucha, S K Sitaraman, "Micro-Scale Plasticity Effects in Microvia Reliability Analysis", 2002 Electronic Components and Technology Conference, pp. 1304-1309, 2002
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(2002)
2002 Electronic Components and Technology Conference
, pp. 1304-1309
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Ramakrishna, G.1
Pucha, R.V.2
Sitaraman, S.K.3
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11
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0027262145
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Mechanical integrity of vias in a thin-film package during manufacture, assembly and stress-test
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June
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G Subbarayan, K Ramakrishna, B G Sammakia, P C Chen, "Mechanical Integrity of Vias in a Thin-Film Package During Manufacture, Assembly and Stress-Test", 1993 Electronic Components and Technology Conference, pp. 276-279, June 1993
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(1993)
1993 Electronic Components and Technology Conference
, pp. 276-279
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Subbarayan, G.1
Ramakrishna, K.2
Sammakia, B.G.3
Chen, P.C.4
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