-
1
-
-
0031361999
-
Design considerations for using integrated passive components
-
Denver, CO
-
J. P. Parkerson, L. Schaper, and T. Lenihan, "Design considerations for using integrated passive components," in Proc. Int. Conf. Multichip Modules MCM, Denver, CO,1997,pp.345-350.
-
(1997)
Proc. Int. Conf. Multichip Modules MCM
, pp. 345-350
-
-
Parkerson, J.P.1
Schaper, L.2
Lenihan, T.3
-
2
-
-
0007997849
-
Future trends toward integral passives
-
(Key note address), FL, Mar. 24-27
-
J. Rector, J. Dougherty, V. Brown, J. Galvagni, and J. Prymak, "Future trends toward integral passives,"presented at the CARTS US'97 (Key note address), FL, Mar. 24-27, 1997.
-
(1997)
CARTS US'97
-
-
Rector, J.1
Dougherty, J.2
Brown, V.3
Galvagni, J.4
Prymak, J.5
-
3
-
-
0030654931
-
Integrated and integral passive components: A technology roadmap
-
"Integrated and integral passive components: A technology roadmap," in Proc. IEEE Electric Components and Technology Conf., 1997, pp. 713-723.
-
(1997)
Proc. IEEE Electric Components and Technology Conf.
, pp. 713-723
-
-
-
4
-
-
0032311888
-
Integrated Passive Components Using Low Temperature Cofire Ceramics
-
San Diego, CA
-
W. Wersing, S. Gohlke, R. Matz, W. Eurskens, V. Wannenmacher, "Integrated Passive Components Using Low Temperature Cofire Ceramics,"Proceedings of International Symposium on Microelectronics, San Diego, CA, pp. 193-199, 1998.
-
(1998)
Proceedings of International Symposium on Microelectronics
, pp. 193-199
-
-
Wersing, W.1
Gohlke, S.2
Matz, R.3
Eurskens, W.4
Wannenmacher, V.5
-
5
-
-
0034833652
-
Buried Passive Used with Thick-Film Processes on Alumina for High Frequency Applications
-
Santa Clara, CL
-
Randy Wu, Major Chi, Ken Wu, Fred Hyatt, Bin-Chyi Tseng, "Buried Passive Used with Thick-Film Processes on Alumina for High Frequency Applications,"Proceedings of the international conference and exhibition on high density interconnect and system packaging, Santa Clara, CL, 2001.
-
(2001)
Proceedings of the International Conference and Exhibition on High Density Interconnect and System Packaging
-
-
Wu, R.1
Chi, M.2
Wu, K.3
Hyatt, F.4
Tseng, B.-C.5
-
6
-
-
24644463342
-
Integral Passive in Multi-dielectric Substrate
-
Boston
-
L. K. Wu, B. C. Tseng, L. C. Liao, "Integral Passive in Multi-dielectric Substrate," Proceedings of international Symposium on Microelectrics, Boston, pp. 438-442, 2000.
-
(2000)
Proceedings of International Symposium on Microelectrics
, pp. 438-442
-
-
Wu, L.K.1
Tseng, B.C.2
Liao, L.C.3
-
7
-
-
0002906782
-
Test Characterize High-Frequency Material Properties
-
Aug
-
D. I. Amey, S. J. Horowitz, "Test Characterize High-Frequency Material Properties, "Microwave& RF, vol. 36, no. 8, pp. 68-80, Aug. 1997.
-
(1997)
Microwave& RF
, vol.36
, Issue.8
, pp. 68-80
-
-
Amey, D.I.1
Horowitz, S.J.2
-
8
-
-
84954040877
-
Dielectric Measurement of Substrates and Packaging Material
-
Denver, CO
-
J. B. Jarvis, B. Riddle, "Dielectric Measurement of Substrates and Packaging Material,"proceedings of International Conference on High Density Interconnect and Systems Packaging, Denver, CO, pp. 178-181, 2000.
-
(2000)
Proceedings of International Conference on High Density Interconnect and Systems Packaging
, pp. 178-181
-
-
Jarvis, J.B.1
Riddle, B.2
|