|
Volumn 5753, Issue I, 2005, Pages 467-475
|
Material design and evaluation of nanocomposite resist for next generation lithography
|
Author keywords
Adamantyl methacrylate; E beam lithography; Hydroxystyrene; KrF lithography; Nanocomposites; Resist
|
Indexed keywords
ADAMANTYL METHACRYLATE;
HYDROXYSTYRENE;
KRF LITHOGRAPHY;
NANOCOMPOSITES;
RESISTS;
ETCHING;
FREE RADICAL POLYMERIZATION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
METALLIC FILMS;
NANOSTRUCTURED MATERIALS;
ORGANIC POLYMERS;
POLYCRYSTALS;
SYNTHESIS (CHEMICAL);
ELECTRON BEAM LITHOGRAPHY;
|
EID: 24644453953
PISSN: 16057422
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.597308 Document Type: Conference Paper |
Times cited : (12)
|
References (9)
|