Dielectric behavior of ultrahigh-k carbon black composites for embedded capacitor applications

Proceedings - Electronic Components and Technology Conference

Volumn 2, Issue , 2005, Pages 1864-1869

  Xu, Jianwen ^a   Wong, C P ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LOSS; EMBEDDED CAPACITORS; FREQUENCY DEPENDENCE;

AGGLOMERATION; CAPACITORS; COMPOSITE MATERIALS; DIELECTRIC MATERIALS; EMBEDDED SYSTEMS; INTERFACES (MATERIALS); PARTICLE SIZE ANALYSIS; PERMITTIVITY; SILICA; SURFACE CHEMISTRY;

CARBON BLACK;

EID: 24644431603     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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