Ultrathin Cu films on Mo(110) characterized by helium implantation

Materials Research Society Symposium - Proceedings

Volumn 792, Issue , 2003, Pages 351-356

  Venugopal, Vinay ^a   Thijsse, Barend J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DESORPTION; FILM GROWTH; HELIUM; ION IMPLANTATION; MOLYBDENUM; NANOSTRUCTURED MATERIALS; POINT DEFECTS; SPECTROMETRY; SUBSTRATES;

DISSOCIATION ENERGIES; MEAN RESIDENCE TIMES (MRT); ROOM TEMPERATURE; THERMAL HELIUM DESORPTION SPECTROMETRY (THDS);

ULTRATHIN FILMS;

EID: 2442692868     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-792-r10.5     Document Type: Conference Paper

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