Fundamental limits of optical microrheology

Journal of Colloid and Interface Science

Volumn 275, Issue 1, 2004, Pages 322-327

  Helseth, L E ^a   Fischer, T M ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DETECTORS; PARTICLE BEAM TRACKING; SIGNAL TO NOISE RATIO;

NONDIFFERENTIAL DETECTION; OPTICAL MICRORHEOLOGY; PARTICLE TRACKING SYSTEMS; TOTAL INTERNAL REFLECTION MICROSCOPY (TIRM);

RHEOLOGY;

ACCURACY; ANALYTIC METHOD; ARTICLE; DIFFUSION COEFFICIENT; FLOW KINETICS; LASER; MATHEMATICAL ANALYSIS; MICROSCOPY; NOISE; OPTICS; PRIORITY JOURNAL; SIGNAL NOISE RATIO;

EID: 2442660047     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2004.01.052     Document Type: Article

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