Monotonic testing and tension-tension fatigue testing of free-standing Al microtensile beams

Materials Research Society Symposium - Proceedings

Volumn 795, Issue , 2003, Pages 423-428

  Barbosa III, Nicholas ^a   El Deiry, Paul ^a   Vinci, Richard P ^a  

^a Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; FATIGUE TESTING; GRAIN BOUNDARIES; PLASTICITY; STRAIN RATE; STRESS ANALYSIS; STRESS RELAXATION; TENSILE TESTING;

MICROTENSILE BEAMS; MONOTONIC TESTING; PIEZOELECTRIC LOAD CELLS; STRESS RECOVERY;

THIN FILMS;

EID: 2442610709     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-795-u11.39     Document Type: Conference Paper

References (6)

1. W. D. Nix, Met. Trans. A 20A, (1989) 2217-2245.
2. E. Arzt, Acta Mater. 46, (1998) 5611-5626.
3. El-Deiry, P.A., Vinci, R.P., Thin Films: Stresses and Mechanical Properties IX, Materials Research Society, 695, (2001) L4.2.
4. Kraft, O., Shwaiger, R., Wellner, P., Materials Science and Engineering A319-321, (2001) 919-923.
5. Keller, Robert R.; Monig, Reiner; Volkert, Cynthia A.; Arzt, Eduard; Schwaiger, Ruth; Kraft, Oliver, AIP Conference Proceedings (2002), 612 (Stress-Induced Phenomena in Metallization), 119-132.
6. Guido Cornella, Ph.D. Dissertation, Stanford University (1999).