Dielectric studies of vacuum-evaporated CeF 3 thin films

Journal of the Korean Physical Society

Volumn 44, Issue 4, 2004, Pages 911-914

  Gowtham, M ^a   Kim, D Y ^a   Mangalaraj, D ^a   Yi, J ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

Dielectric loss; Dielectric relaxation; Ionic conductivity; Modulus spectra; Oxygen sensor

Indexed keywords

EID: 2442610545     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)

1. T. Takeuchi, Proc. 2nd Int. Mat. Chemical Sensors (Bordeaux, 1986), p. 69.
2. H. D. Wiemhofer and W. Gopel, Sensors and Actuators B 4, 365 (1991).
3. C. Hoffl, H. D. Wiemhofer, O. Glumov and I. V. Murin, Solid State Ionics 101, 445 (1997).
4. Guo-Long Tan, Xi-Jun Wu, Li-Ren Wang and Yu-Quan Chen, Sensors and Actuators B 34, 417 (1996).
5. Jeffrey W. Fergus, Sensors and Actuators B 42, 119 (1997).
6. N. Miura, J. Hisamoto, N. Yamazoe, S. Kuwata and J. Salardenne, Sensors and Actuators B 16, 301 (1989).
7. V. V. Daniel, Dielectric Relaxation (Academic Press, London, 1967).
8. A. K. Jonscher, Dielectric Relaxation of Solids (Chelsea Dielectric Press, London, 1983).
9. F. S. Howell, R. A. Bose, P. B. Macedo and C. T. Moyniham, J. Phys. Chem. 78, 639 (1974).
10. Jin-Soo Kim, Jung-Won Cha, Chung-Sik Kim and Jung-Nam Kim, J. Korean Phys. Soc. 29, 365 (1996).
11. Introduction to Ceramics, edited by W. D. Kingery, 2nd ed. (Wiley, New York, 1976), p. 939.
12. M. S. Tai and T. Y. Tseng, J. Mater. Chem. Phys. 57 47 (1998).
13. P. B. Macedo, C. T. Moyniham and R. Bose, Phys. Chem. Glasses 13, 171 (1972).
14. G. Williams and D. C. Watts, Trans. Faraday Soc. 66, 80 (1970).
15. C. T. Moyniham, L. P. Boesch and N. L. Laberge, Phys. Chem. Glasses 14, 122 (1973).