Preparation of ternary alloy libraries by means of thick film deposition and interdiffusion: Structure and mechanical properties

Materials Research Society Symposium - Proceedings

Volumn 804, Issue , 2003, Pages 63-68

  Rar, A ^a,b   Specht, E D ^a   Meyer III, H M ^a   Santella, M L ^a   George, E P ^a,b   Pharr, G M ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DEPOSITION; DIFFUSION; ELECTRON BEAMS; ENERGY DISPERSIVE SPECTROSCOPY; FLUORESCENCE; INDENTATION; NICKEL ALLOYS; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SCREENING; THICK FILMS; X RAY DIFFRACTION ANALYSIS;

COMBINATORIAL METHODS; INTERDIFFUSION; NANOIDENTATION; QUATERNARY ALLOYS;

TERNARY SYSTEMS;

EID: 2442587373     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-804-jj9.2     Document Type: Conference Paper

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