Direct measurement of evanescent wave interference with a scanning near-field optical microscope

Chinese Physics Letters

Volumn 21, Issue 5, 2004, Pages 907-910

  Hong, Tao ^a   Wang, Jia ^a   Xu, Tie Jun ^a   Sun, Li Qun ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PROBES; SCANNING; WAVE INTERFERENCE;

DIRECT MEASUREMENT; EVANESCENT WAVE INTERFERENCE; INTERFERENCE FRINGE; INTERFERENCE PATTERNS; MEASUREMENTS OF; PHOTON SCANNING TUNNELING MICROSCOPE; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SPATIAL PERIODS; THEORETICAL VALUES; TRAPPED PARTICLE;

EVANESCENT FIELDS;

EID: 2442576892     PISSN: 0256307X     EISSN: None     Source Type: Journal    
DOI: 10.1088/0256-307X/21/5/041     Document Type: Article

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