Direct measurement of evanescent wave interference patterns with laser-trapped dielectric and metallic particles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3740, Issue , 1999, Pages 323-326

  Gu, Min ^a   Ke, Pu Chun ^a  

^a VICTORIA UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EVANESCENT WAVES; NEAR FIELD SCANNING OPTICAL MICROSCOPY (NSOM); SHEAR FORCE OPTICAL MICROSCOPY;

DIELECTRIC MATERIALS; LASER APPLICATIONS; LIGHT INTERFERENCE; NANOTECHNOLOGY; OPTICAL MICROSCOPY; PARTICLES (PARTICULATE MATTER); SCANNING; SCANNING TUNNELING MICROSCOPY;

IMAGING TECHNIQUES;

EID: 0032596992     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (5)