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Volumn 786, Issue , 2003, Pages 9-16

Ab-initio study on the γ-Al2O3 surfaces and interfaces

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ELECTRONIC STRUCTURE; MOSFET DEVICES; PERMITTIVITY; PROBABILITY DENSITY FUNCTION; SEMICONDUCTING ALUMINUM COMPOUNDS; STOICHIOMETRY; STRUCTURAL ANALYSIS; THIN FILMS;

EID: 2442482801     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-786-e5.2     Document Type: Conference Paper
Times cited : (4)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.