On mismatch in the deep sub-micron era - From physics to circuits

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn , Issue , 2004, Pages 62-67

  Topaloglu, Rasit Onur ^a   Orailoglu, Alex ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT PACKAGES; MONTE CARLO ANALYSIS (MCA); STATISTICAL TRANSISTORS;

COMPUTER SIMULATION; ERROR ANALYSIS; MATHEMATICAL MODELS; MONTE CARLO METHODS; PARAMETER ESTIMATION; STATISTICS; TRANSISTORS;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 2442431638     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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