Morphological characterization of point patterns

Biometrical Journal

Volumn 47, Issue 4, 2005, Pages 473-488

  Mecke, K R ^a   Stoyan, D ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

Distance characteristic; Euler characteristic; Forest; Integral geometry; Point process; Second order characteristic; Statistical estimation

Indexed keywords

DISTANCE CHARACTERISTIC; EULER CHARACTERISTIC; FOREST; INTEGRAL GEOMETRY; MORPHOLOGICAL CHARACTERIZATION; POINT PATTERNS; POINT PROCESS; SECOND ORDERS; SECOND-ORDER CHARACTERISTIC; STATISTICAL ESTIMATION;

STATISTICS;

EID: 24144496067     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/bimj.200310137     Document Type: Article

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