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Volumn 3395, Issue , 2005, Pages 110-124

Using model checking for reducing the cost of test generation

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL SYSTEM ANALYSIS; COST EFFECTIVENESS; DATA ACQUISITION; MATHEMATICAL MODELS;

EID: 24144476612     PISSN: 03029743     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-3-540-31848-4_8     Document Type: Conference Paper
Times cited : (8)

References (20)
  • 3
    • 0027543681 scopus 로고
    • Unconstrained edges and their application to branch analysis and testing of programs
    • Feb.
    • A. Bertolino, "Unconstrained Edges and Their Application to Branch Analysis and Testing of Programs," The Journal of Systems and Software, 20(2):125-133, Feb. 1993.
    • (1993) The Journal of Systems and Software , vol.20 , Issue.2 , pp. 125-133
    • Bertolino, A.1
  • 4
    • 0028731942 scopus 로고
    • Automatic generation of path covers based on the control flow analysis of computer programs
    • Dec.
    • A. Bertolino and M. Marré, "Automatic Generation of Path Covers Based on the Control Flow Analysis of Computer Programs," IEEE Transactions on Software Engineering, 20(12):885-899, Dec. 1994.
    • (1994) IEEE Transactions on Software Engineering , vol.20 , Issue.12 , pp. 885-899
    • Bertolino, A.1    Marré, M.2
  • 5
    • 0030283406 scopus 로고    scopus 로고
    • How many paths are needed for branch testing?
    • Nov.
    • A. Bertolino and M. Marré, "How Many Paths are Needed for Branch Testing?" The Journal of Systems and Software, 35(2):95-106, Nov. 1996.
    • (1996) The Journal of Systems and Software , vol.35 , Issue.2 , pp. 95-106
    • Bertolino, A.1    Marré, M.2
  • 6
    • 0023349802 scopus 로고
    • Test data selection and quality estimation based on the concept of essential branches for path testing
    • May
    • T. Chusho, "Test Data Selection and Quality Estimation Based on the Concept of Essential Branches for Path Testing," IEEE Transactions on Software Engineering, 13(5):509-517, May 1987.
    • (1987) IEEE Transactions on Software Engineering , vol.13 , Issue.5 , pp. 509-517
    • Chusho, T.1
  • 7
    • 0033295929 scopus 로고    scopus 로고
    • Test development for communication protocols: Towards automation
    • June
    • R. Dssouli, K. Saleh, E. Aboulhamid, A. En-Nouaary, and C. Bourhfir, "Test Development for Communication Protocols: towards Automation," Computer Networks, 31(7):1835-1872, June 1999.
    • (1999) Computer Networks , vol.31 , Issue.7 , pp. 1835-1872
    • Dssouli, R.1    Saleh, K.2    Aboulhamid, E.3    En-Nouaary, A.4    Bourhfir, C.5
  • 9
    • 84888265186 scopus 로고    scopus 로고
    • A temporal logic based theory of test coverage and generation
    • Vol. 2280 of LNCS, Springer-Verlag
    • H.S. Hong, I. Lee, O. Sokolsky, and H. Ural, "A Temporal Logic Based Theory of Test Coverage and Generation," TACAS '02, Vol. 2280 of LNCS, pp. 327- 341, Springer-Verlag, 2002.
    • (2002) TACAS '02 , pp. 327-341
    • Hong, H.S.1    Lee, I.2    Sokolsky, O.3    Ural, H.4
  • 16
    • 0022043004 scopus 로고
    • Selecting software test data using data flow information
    • Apr.
    • S. Rapps and E. J. Weyuker, "Selecting Software Test Data Using Data Flow Information," IEEE Transactions on Software Engineering, 11(4):367-375, Apr. 1985.
    • (1985) IEEE Transactions on Software Engineering , vol.11 , Issue.4 , pp. 367-375
    • Rapps, S.1    Weyuker, E.J.2
  • 17
    • 0035392814 scopus 로고    scopus 로고
    • Coverage metrics for functional validation of hardware designs
    • July/Aug.
    • S. Tasiran and K. Keutzer, "Coverage Metrics for Functional Validation of Hardware Designs," IEEE Design and Test of Computers, 18(4):36-45, July/Aug. 2001.
    • (2001) IEEE Design and Test of Computers , vol.18 , Issue.4 , pp. 36-45
    • Tasiran, S.1    Keutzer, K.2
  • 18
    • 0026141382 scopus 로고
    • A test sequence generation method for protocol testing
    • Apr.
    • H. Ural and B. Yang, "A Test Sequence Generation Method for Protocol Testing," IEEE Transactions on Communications, 39(4):514-523, Apr. 1991.
    • (1991) IEEE Transactions on Communications , vol.39 , Issue.4 , pp. 514-523
    • Ural, H.1    Yang, B.2
  • 19
    • 0033880103 scopus 로고    scopus 로고
    • Test generation based on control and data dependencies within system specifications in SDL
    • Mar.
    • H. Ural, K. Saleh, and A. Williams, "Test Generation Based on Control and Data Dependencies within System Specifications in SDL," Computer Communications, 23(7):609-627, Mar. 2000.
    • (2000) Computer Communications , vol.23 , Issue.7 , pp. 609-627
    • Ural, H.1    Saleh, K.2    Williams, A.3
  • 20
    • 0031354777 scopus 로고    scopus 로고
    • Software unit test coverage and adequacy
    • Dec.
    • H. Zhu, P.A. Hall, and J.H.R. May, "Software Unit Test Coverage and Adequacy," ACM Computing Surveys, 29(4):366-427, Dec. 1997.
    • (1997) ACM Computing Surveys , vol.29 , Issue.4 , pp. 366-427
    • Zhu, H.1    Hall, P.A.2    May, J.H.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.