Correlation-length-based sampling conditions for various engineering surfaces

Measurement Science and Technology

Volumn 16, Issue 9, 2005, Pages 1813-1822

  Nguyen, Anh Tuan ^a   Butler, David Lee ^b  

^a Vietnam National University Ho Chi Minh   (Viet Nam)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Correlation length; Sampling condition; Surface measurement

Indexed keywords

MATHEMATICAL MODELS; SAMPLING; SPECTRUM ANALYZERS;

ANALYTICAL MODELS; CORRELATION LENGTH; HIGH-FREQUENCY CUT-OFF; SAMPLING CONDITIONS;

SURFACE MEASUREMENT;

MEASUREMENT METHOD; SURFACE PROPERTY;

EID: 24144473029     PISSN: 09570233     EISSN: 09570233     Source Type: Journal    
DOI: 10.1088/0957-0233/16/9/014     Document Type: Article

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