High-quality factor optical microcavities using oxide apertured micropillars

Applied Physics Letters

Volumn 87, Issue 3, 2005, Pages

  Stoltz, N G ^a,b   Rakher, M ^a,c   Strauf, S ^a,b,c   Badolato, A ^a,d   Lofgreen, D D ^a,d,e   Petroff, P M ^a,b,d   Coldren, L A ^a,b,d   Bouwmeester, D ^a,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Materials Department   (United States)

^c Physics Department   (Sweden)

^d Electrical Engineering Department   (India)

^e RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL MICROCAVITIES; OPTICAL MODES; SEMICONDUCTOR ETCHED MICROPILLARS;

LIGHT SCATTERING; SEMICONDUCTOR MATERIALS;

SCANNING;

EID: 24144449903     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1999843     Document Type: Article

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